S530
Diagnostic Manual
Appendix A: Non-Kelvin (2W) S530 system diagnostics
Figure 28: Test connections, pins 2 and 3, rows C and D
Non-Kelvin continuity test
The purpose of the continuity test is to determine if the relays of the matrix path under test have
properly closed. To determine this, the resistance of the whole path is measured and calculated. The
test consists of a pin test and a SMU test. The pin test determines if relays are connected to test the
pins, and the SMU test will determine if relays are connected to the SMUs.
Continuity pin test
The pin test uses SMU1 and SMU2 using the Series 2600A instruments. Each pin will be tested with
groups of rows and each group of rows consists of row n and row n+1 (n = 1, 3, 5, 7*). With this
connection, the two SMUs will be connected by two rows and the same pin. Execute the test by
forcing 1mA from the first SMU, forcing 0V from the second, and then measure the voltage and
current with the first SMU. If the resistance is higher than 1Ohm (determined by measuring the
voltage and current), Fail will display in the ACS GUI test log and in the diagnostic report in the
following default directory:
C:\ACS\Projects\Diagnostic\Reports
NOTE
The pair of rows will be tested in reverse order once to test the paths opposite direction. For example,
the row A and B test path will change to row B and A.
Continuity test flow
When a Model 2410 SMU is in your system (high-voltage systems only), only row pair A and B will be
tested by the 2410. The remaining rows will be tested using the Series 2600A instruments. Systems
without a Model 2410 will test rows A through H using the Series 2600A instruments.
Figure 29: Pin test
S530-906-01 Rev. A / March 2011
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