Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-8
S530-907-01 Rev. A / September 2015
bice
This subroutine sweeps the emitter-base voltage (V
BE
), measures the resulting collector-emitter current (I
CE
), and
calculates beta (
)
at each value of V
BE
for a bipolar transistor. The device is connected in the common-emitter
configuration.
Usage
void bice(int
e
, int
b
, int
c
, int
sub
, double
vce
, double
vbe1
, double
vbe2
,
double
vsub
, int
npts
, double ice_last, double
*beta_last
, double
*beta_max
,
double
*ic_max
);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vce
Input
The forced collector-emitter voltage, in volts
vbe1
Input
The start point of the V
BE
sweep, in volts
vbe2
Input
The end point of the V
BE
sweep, in volts
vsub
Input
Substrate bias, in volts
npts
Input
The number of points in the sweep
ice_last
Output
The measured I
CE
array
beta_last
Output
The calculated beta array
beta_max
Output
The maximum beta in the array
ic_max
Output
The I
CE
at maximum beta
Details
The collector-emitter voltage (V
CE
) and the substrate voltage (V
SUB
) are held constant.
In addition to the
and I
CE
return arrays, the maximum
(
beta_max
) and collector current at
maximum
(
ic_max
) are returned.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPNs +V
CE
, +I
BE
,
and -V
SUB
PNPs -V
CE
, -I
BE
,
and -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CE
, maximum current limit, measures I
CE
SMU2: Sweeps V
BE
, maximum current limit, measures I
BE
SMU3: Forces V
SUB
, default current limit
