S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-39
Example
result = iceo(e, b, c, sub, vce, vsub)
Schematic
ices
This subroutine measures collector-emitter/base leakage when the collector-base junction is reverse-biased
(common base).
Usage
double ices(int
e
, int
b
, int
c
, int
sub
, double
vces
, double
vsub
)
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vces
Input
The forced collector-emitter voltage, in volts
vsub
Input
Substrate bias, in volts
Returns
Output
The measured collector-emitter/base leakage current
Details
This subroutine measures the collector-emitter/base leakage at a specified collector-emitter voltage
(V
CES
) and substrate bias (V
SUB
). The base and emitter terminals are shorted to ground.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +V
CES
, -V
SUB
PNP -V
CES
, -V
SUB
