3-12
SeCTIon 3
Bipolar Transistor Tests
vstart
•
: 0V
vstop
•
: 10V
vsteps
•
: 100
After setup, the output is zeroed and enabled . A linear voltage
sweep from the start to the stop value is performed . At each step,
the collector-emitter current (I
CEO
) is measured .
Upon sweep completion, the output is disabled and the data is
written to the Instrument Console window of TSB .
3.6.5 Modifying Program 8
For different sweep values, simply modify the
vstart
,
vstop
,
and
vstep
values and source range parameter as appropriate .
In order to speed up the test procedure, you may wish to use
a faster integration period . Simply change the
l _ nplc
value .
Note, however, that changing this parameter may result in unac-
ceptable reading noise .
I
CEO
vs. V
CEO
(2N3904)
V
CEO
(Volts)
I
CEO
vs. V
CEO
I
C
EO
(
A
m
p
s)
3.50E–10
3.00E–10
2.50E–10
2.00E–10
1.50E–10
1.00E–10
5.00E–11
0.00E+00
0
2
4
6
8
10
Figure 3-8. Program 8 results: I
Ceo
vs. V
Ceo
Summary of Contents for Series 2600
Page 5: ......
Page 7: ......
Page 17: ...2 8 Section 2 Two terminal Device Tests...
Page 39: ...4 10 Section 4 FET Tests...
Page 53: ...6 4 Section 6 High Power Tests...
Page 130: ...A 77 Appendix A Scripts BJT_Comm_Emit_Vsb...
Page 136: ...Click below to find more Mipaper at www lcis com tw Mipaper at www lcis com tw...