Model 2470 High Voltage SourceMeter Instrument User's Manual
Section 6: Measure I-V characteristics of FETs
2470-900-01 Rev. A /
May
2019
6-5
To set the 2470 TSP-Link nodes from the front panel:
1.
Press the
MENU
key.
2.
Under System, select
Communication
. The SYSTEM COMMUNICATION window opens.
3.
On the
TSP-Link
tab, set
Node
to the node number of this instrument and select
OK
.
4.
Select
Initialize.
5.
Press the
HOME
key to return to the Home screen.
Repeat these steps for each 2470 instrument in your TSP-Link network.
Device connections
Device connections vary depending on the test you will perform. Since these applications typically
involve measuring very low currents, it is recommended that you use the triaxial connections on the
rear-panel of the 2470 with low-noise triaxial cables. Triaxial cables provide the lowest noise possible
when measuring low currents.
Drain leakage current measurement device connections
A drain leakage current measurement on a FET requires only one 2470. For this measurement, the
gate-source potential must be 0 V, so the gate and source connection pins are shorted together. The
SMU is connected between the drain and source to apply a bias voltage.
To change this measurement to a gate leakage current measurement, you can short the drain and
source together and connect the 2470 between the gate and source to apply a bias voltage.
The following figure shows the setup for a drain leakage current measurement.
Summary of Contents for SourceMeter 2470
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