52
Keysight M809256PB OIF CEI-56G Rx Test Automation Application User Guide
4
OIF CEI-56G VSR PAM4 Calibrations
Calibration Parameters in Debug Mode
The Debug Mode in the Configure tab of the Test Application consists of
some parameters in addition to those that can be configured in the
Compliance Mode. Besides, for some of the configuration options, you may
enter custom values, which provides a greater flexibility in performing
calibrations and tests.
For each VSR Host Input and VSR Module Input standard options, the
following parameters are available for configuration. Note that other than
the “Test Method” parameter, rest of the parameters appear for both
standard options.
Parameters common for all calibrations
• Baud Rate
• Victim Generator PAM4 Symbol Mapping
• Victim Generator PAM4 Custom Symbol Mapping
• Loop Bandwidth
• SIRC Response
• SIRC Bandwidth
• Eye Height/Width Probability
Common Parameter for all VSR Host Input calibrations only
• Test Method—If ‘Far-end’ is selected, configure the “Far-end Channel”
parameter for “Stressed Eye Calibration”.
Parameters for Crosstalk Calibration
• Crosstalk Amplitude
• Crosstalk Slew Time
Parameters for BUJ Calibration
• BUJ