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4.6 Eyepiece graticules*
Graticules for length measurements and grain
and particle measurements
Our product range comprises the following grati-
cules:
• Graticule
10 mm/100 divisions
Order no. 506950
• Graticule 10 mm/100 divisions
with crosshair
Order no. 506952
• Graticule for standard series
and Snyder-Graff method
Order no. 566950
• Graticule ASTM-E-112,
grain size determination
Order no. 566951
• Graticule with 10 x10 x 0.1 mm
grid divisions
Order no. 506954
• Graticule with 10 x10 x1 mm
grid divisions
Order no. 506955
• Graticule with
crosshair
Order no. 506953
• Graticule with
10 mm/200 divisions
Order no. 506951
• Format graticule F6 for photomicro
(for MPS with HC 10 x
photoeyepiece)
Order no. 506951
• Format graticule F7
for photomicro (for DMLD
with HC 10 x photoeyepiece) Order no. 506962
• Format graticule F8
for photomicro (for DMLD
and MPS with
HC 12.5 x photoeyepiece)
Order no. 506963
For calibrating the graticules, we recommend:
Incident light stage micrometer,
1 mm = 100 divisions
Order no. 563011
