8
Appendix
EDBC250SIO | 2.0
106
Id
Hex
Explanation
2830
0B0E
h
FSOE_INVALID_TP_OUT_DURATION
FailSafeOverEtherCAT – invalid safety output
parameter test pulse duration (ErrReg: 16)
2831
0B0F
h
FSOE_INVALID_TP_OUT_FREQUENCY
FailSafeOverEtherCAT – invalid safety output test
pulse frequency (ErrReg: 16)
2832
0B10
h
FSOE_INVALID_WATCHDOG_TIME
FailSafeOverEtherCAT – invalid safety parameter
watchdog time (ErrReg: 16)
2833
0B11
h
FSOE_INVALID_INP_EXT_SUPPLY
FailSafeOverEtherCAT – invalid safety parameter for
inputs having external supply (ErrReg: 16) or inputs
not used according to parameter setup
2834
0B12
h
FSOE_INVALID_INP_IN_USE
FailSafeOverEtherCAT – invalid safety parameter for
inputs in use (ErrReg: 16)
2835
0B13
h
FSOE_INVALID_INP_USED_EXT_MISMATCH
FailSafeOverEtherCAT – mismatch of safety
parameters for inputs in use and externally supplied
inputs (ErrReg: 16)
2836
0B14
h
FSOE_INVALID_OUT_IN_USE
FailSafeOverEtherCAT – invalid safety parameter for
outputs in use (ErrReg: 16)
2837
0B15
h
FSOE_INVALID_OUT_USED_EXT_MISMATCH
FailSafeOverEtherCAT – mismatch of safety
parameters for outputs in use and externally
earthed outputs (ErrReg: 16)
2944
0B80
h
FSOE_EXTENDED_ERROR
FailSafeOverEtherCAT – test pulse error in mode
selector mode, extended error (ErrReg: 16)
2992
0BB0
h
FSOE_ERROR
FailSafeOverEtherCAT – invalid internal state in
safety stack (ErrReg: 16)
3072
0C00
h
TH_GLOBAL_ERROR
Global hardware test error
3073
0C01
h
TH_TIMEOUT
Internal hardware test sequence timeout
3329
0D01
h
MC1_ID_INVALID
Identification of MC 1 failed
3330
0D02
h
MC2_ID_INVALID
Identification of MC 2 failed
3331
0D03
h
MC3_ID_INVALID
Identification of MC 3 failed
3584
0E00
h
FOREIGN_ERROR_DETECTED
Error detected by other MC
3841
0F01
h
FLASH_TIMEOUT
Timeout writing to FLASH
3842
0F02
h
FLASH_LOCKED
FLASH operation failed because ''LOCK'' bit could
not be reset
3851
0F0B
h
FLASH_BUSY
FLASH operation busy,
sequence error in FLASH programming
3854
0F0E
h
FLASH_ERROR
FLASH operation error,
programmer the FLAH memory failed