17
C166 Debug Concept
The debugging of the C166 uses the OCDS and the Cerberus.
The X-GOLDTM102 also inlcudes a Real Time Trace module for software debugging.
TEAKLite Debug Concept
TEAKlite debugging uses the OCEM and the SEIB.
3.1.9 Power Management
The X-GOLDTM102 provides the power management unit (PMU) for the complete mobile phone
application. The integrated PMU is directly connected to the battery and provides a set of linear
voltage regulators (LDO’s). These LDO’s generate all required supply voltages and currents
needed in a low feature mobile phone.
The charger unit controls the charging of NiCd, NiMh, LiPolymer and LiON batteries. Only a few
external parts are required to support charging from a DC wall adaptor. In addition, the charger
generates the power-on reset after battery insertion or charger connection. The supported battery
voltage range is 3.1 to 5.1 V for NiCd/NiMH and 3.1 to 4.6 V for LiPolymer and LiON batteries. The
upper voltage limit is programmable.The charger supports constant current precharging,
full-charging (pulsed charging) and software controlled constant current charging. The charging
functions are protected by hardware timer. Charger idle voltages up to 20 V can be handled. An
integrated overvoltage protection protects batteries and system against overvoltage.
White/blue backlight generation is supported with a special driver for very a low external parts
count. Power consumption during operation phases is minimized due to flexible clock switching
In the Standby Mode most parts of the device are switched off, only a small part is running at
32kHz and the
controller RAM is switched to a power saving mode. The TEAKLite ROM can be switched off
during Standby via SW.
This Units (associated to the Measurement Unit) provides also support for a accessory
detection .
3.1.10 On-Chip Security Concept
Secure boot is based on a public/private key approach. Flash images that are not signed with the
private key during phone manufacture cannot be loaded. Verification of the Flash code is done with
the public key. The public key as well as hash and verify algorithms are stored in the ROM, which
ensures a hardware secured boot procedure.
The following security features are supported:
• Prevention of illegal Flash programming
• Flash programming makes use of the X-GOLDTM102 ID for personalization checks with IMEI and
SIM-lock protection
The security features use the following mechanism:
• Boot ROM flow:
– Controls the boot transition to external flash
– Controls the flash update
Summary of Contents for GB130kf750
Page 12: ...12 3 TECHNICAL BRIEF 3 1Digital Main Processor Figure 3 1 PMB7890 FUNCTIONAL BLOCK DIAGRAM ...
Page 28: ...28 ...
Page 29: ...29 Pin Description ...
Page 35: ...35 Circuit Diagram TP1 TP6 TP2 TP4 TP 3 TP5 ...
Page 36: ...36 Checking Flow ...
Page 37: ...37 4 2 SIM Card Trouble Test Point Circuit Diagram ...
Page 38: ...38 Checking Flow ...
Page 39: ...39 4 3 Vibrator Trouble Test Point Circuit Diagram ...
Page 40: ...40 Checking Flow NG ...
Page 41: ...41 4 4 Keypad Trouble Test Point ...
Page 42: ...42 Circuit Diagram ...
Page 43: ...43 ...
Page 44: ...44 Checking Flow ...
Page 45: ...45 4 5 RTC Trouble Test Point Circuit Diagram ...
Page 46: ...46 Checking Flow ...
Page 47: ...47 4 6 Key Backlight Trouble 4 6 1 Main Key Board LED ...
Page 48: ...48 Circuit Diagram Checking Flow ...
Page 49: ...49 4 6 2 Upper Key Board LED Circuit Diagram TP1 ...
Page 50: ...50 Checking Flow ...
Page 51: ...51 4 7 LCM Backlight Trouble Test Point Circuit Diagram ...
Page 52: ...52 Checking Flow ...
Page 53: ...53 4 8 LCM Trouble Test Point Circuit Diagram ...
Page 54: ...54 Checking Flow ...
Page 55: ...55 4 9 Microphone Trouble Test Point Circuit Diagram TP1 ...
Page 56: ...56 Checking Flow ...
Page 57: ...57 4 10 Receiver Trouble Test Point ...
Page 58: ...58 Circuit Diagram ...
Page 59: ...59 Checking Flow ...
Page 60: ...60 4 11Speaker Trouble Test Point ...
Page 61: ...61 Circuit Diagram ...
Page 62: ...62 Checking Flow ...
Page 63: ...63 4 12 Headphone Trouble Test Point Circuit Diagram ...
Page 64: ...64 ...
Page 65: ...65 Checking Flow ...
Page 66: ...66 ...
Page 67: ...67 4 13 Charging Trouble Test Point Circuit Diagram TP1 TP4 TP3 TP5 TP2 ...
Page 68: ...68 Checking Flow ...
Page 69: ...69 4 14 FM Radio Trouble Test Point ...
Page 70: ...70 Circuit Diagram ...
Page 71: ...71 Checking Flow ...
Page 72: ...72 ...
Page 74: ...74 RF Trouble TEST POINT ...
Page 76: ...76 ...
Page 77: ...77 RX Trouble TEST POINT ...
Page 78: ...78 CIRCUIT TP5 TP6 TP3 TP4 TP1 TP2 ...
Page 79: ...79 CHECKING FLOW ...
Page 80: ...80 TEST POINT CIRCUIT TP1 TP2 TP5 TP6 TP3 TP4 TP2 TP1 ...
Page 81: ...81 WAVE FORM CHECKING FLOW Replace X301 ...
Page 82: ...82 TX Trouble TEST POINT ...
Page 83: ...83 CIRCUIT WAVE FORM TP5 TP6 TP3 TP4 TP2 TP1 ...
Page 84: ...84 TEST POINT ...
Page 85: ...85 CHECKING FLOW ...
Page 86: ...86 Signal configuration CHECKING FLOW ...
Page 87: ...87 TROUBLE SHOOTING TEST POINT CIRCUIT TP5 TP6 TP3 TP4 TP1 TP2 ...
Page 88: ...88 WAVE FORM ...
Page 89: ...89 CHECKING FLOW ...
Page 90: ...90 5 DOWNLOAD 5 1 Download Setup ...
Page 100: ...100 3 DownLoad Fail If download fail that it will show red and display progress in log window ...
Page 101: ...101 Fig 2 DownLoad success DownLoad Pass will display green color ...
Page 102: ...102 6 BLOCK DIAGRAM ...
Page 103: ...103 7 CIRCUIT DIAGRMA ...
Page 104: ...104 ...
Page 105: ...105 ...
Page 106: ...106 ...
Page 107: ...107 ...
Page 108: ...108 ...
Page 109: ...109 ...
Page 110: ...110 ...
Page 111: ...111 ...
Page 112: ...112 8 BGA IC PIN Check 8 1 BGA PIN Check of MCU PMB7890 BGA use BGA non use ...
Page 113: ...113 8 2 BGA PIN Check of Memory S71GL064NA0BFW0Z0 BGA use BGA non use ...
Page 137: ...137 13 EXPLODED VIEW REPLACEMENT PART LIST 13 1 EXPLODED VIEW ...
Page 138: ...138 Ass y exploded view ...