N-DIN-MSG
(2044)
Doc. N°
MO-0348-ING
Copyright 2010 (19)
Fw
RMB
360.11.0.x
FFP
360.6.0
Date
25.02.2008
Rev.
0
Pag.
24
of
31
6.5
– Event Recording
The N-DIN records any tripping and stores the information relevant to the last five events (FIFO).
Each event recording includes the following information.
-
“ Real Time Meas “
-
“ Event Records “
-
1
st
event,
-
to scroll available events,
-
to “ Record # “ selected,
-
to select the different fields;
Display
Description
Func
xxxxx
Indication of the protection function which caused the relay tripping.
For indication of the TRIP Cause the following acronyms are used:
-
1RGs
=
1
st
element of system “S”
-
1RGd
=
1
st
element
of system “D”
-
2RGs
=
2
nd
element of system “S”
-
2RGd
=
2
nd
element of system “D”
Date
: YYYY/MM/GG
Date: Year/Month/Day
Time
: hh:mm:ss:cc
Time: hours/minutes/second/hundredths of seconds
Is
: 0
– 600
mA
RMS value of the fault or leakage curre
nt of the systems “S”
Id
: 0
– 600
mA
RMS value of the fault or leakage current of the systems “D”
V
: 0.00
– 66.00
V
RMS value of the monitoring voltage applied by the Main Injection Unit to the systems
under supervision.
RGs
: 0
– 65000
Insulation r
esistance of the section “S”
RGd
0
– 65000
Insulation resistance of the section “D”
cos s
: 0.0
– 1.00
-
Power factor of the current of the section “S”
cos d
: 0.0
– 1.00
-
Power factor of the current of the section “D”
-
to go back to “ Record # “,
-
to go back to “ Real Time Meas “.
