February 2019
65
QUANTX-300
Condition of System
Load Previous Calibration
Lamp installed or replaced
X
Lamp aging
X
Slit width adjusted
X
Monitor and Reflection Gains remain the same
Monitor or Reflection Gains changed
X
Chopper frequency changed
PV Sample Gains changed
Test different PV samples
Bias voltage applied to sample changed
Room temperature changed > ±3C
X
Sample Temperature (only) changed
Sample averaging changed
Input switched from BNC to 4-Wire Terminal
Start / Stop wavelength changed (within
calibrated wavelength range)
Step wavelength changed (
>1nm)
Calibrated with supplied Reference Detector
Calibrated with different Reference Detector
X
Calibrated with supplied Reflectance Standards
Calibrated with different Reflectance Standards
X
Sample stage moved so sample is out of focal
plane
X
Sample stage moved so sample is returned to
focal plane
Reflectance Detector Calibration
1. Place reflection standards on sample plate at the focal plane of beam. Adjust the height of the
sample stage so that the beam is well focused on the white rectangular indicator next to the
standards. Make sure the high and low reflection surfaces are clean and free of dust.
2. Center
the
High R
reflector under the output beam of the QUANTX-300
Center the high reflective sample under the output beam at 555nm.