Chapter 1
Microscopy Procedures
21
Micr
oscopy
Pr
oced
ures
Sensitive T
int
Plate
Mi
croscopy
Chapter 1-4
4
Sensitive Tint Plate Microscopy
4.1
System Configuration and Controls
This section explains an example system configuration and the controls required for sensitive polarization microscopy
using the ECLIPSE Ci-S/Ci-L.
Names of components are denoted in the following manner:
[Polarizer unit for first-order red compensation]
.
CLAMP
T
O
RQ
UE
ND4
ND8
OUT
IN
ND4
ND8
OUT
IN
DSC
MODEL ECLIPSE Ci-S
NIKON CORPORATION
TOKYO, JAPAN
100–240V~
0.9A
50/60Hz
MADE IN CHINA
This device complies with Part 15 of the FCC
Rules. Operation is subject to the following two
conditions:
(1) this device may not cause harmful interference,
and (2) this device must accept any interference
received, including interference that may cause
undesired operation.
This Class A digital apparatus complies with
Canadian ICES-003.
Cet appareil numérique de la classe A est
confirme à la norme NMB-003 du Canada.
9 4 0 001
4N75
INSPECTION
EQUIPMENT
70
60
50
40
30
20
10
0
90
80
Condenser focus knob
Dia-illumination
brightness control knob
Grip
Condenser centering
screw
AC inlet
Input voltage
label
[Eyepiece]
[Objective]
[Stage]
[Polarizer unit for
first-order
red compensation]
[Tube]
[Nosepiece]
[Main unit]
(The figure shows
ECLIPSE Ci-S.)
Diopter adjustment ring
Coarse focus torque
adjustment knob
Optical path
switching lever
Coarse focus knob
Fine focus knob
Moving claw of the
specimen holder
Condenser focus knob
Lamphouse
DSC connector
Analyzer IN/OUT knob
[Analyzer tube for
first-order
red compensation]
[Condenser]
X knob
Y knob
Power switch
Capture button
ND filter IN/OUT switch
(equipped with Ci-S only)
Field diaphragm dial
Coarse focus clamp ring
Coarse focus knob
Fine focus knob
Aperture diaphragm
lever