NXP Semiconductors
UM11777
FRDMGD3160HB8EVM half-bridge evaluation board
Status tab
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Allows monitoring of Status 1, Status 2, and Status 3 register values
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Status 1 and Status 2 faults can be cleared
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Status mask registers can be modified when in configuration mode
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Red indicates, that a fault has been latched
Figure 31. Status tab
Pulse tab
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Used for double pulse, short circuit, and PWM testing
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Select desired T1, T2, and T3 timings for each test type; select enable then generate
pulses
Figure 32. Pulse tab
UM11777
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User manual
Rev. 1 — 6 May 2022
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