19
E3X-NA
E3X-NA
Chemical-
resistant
Teflon-cov-
ered *1; with-
stands
chemicals and harsh envi-
ronments (operating ambi-
ent temperature:
−
30
°
C to
70
°
C)
E3X-NA
@
(V)
4.0-mm dia.
(0.2-mm dia.)
40 mm
E3X-NAG
@
E3X-NA
@
F
4.0-mm dia.
(0.7-mm dia.)
Teflon-cov-
ered *1; side-
view; with-
stands chemicals and
harsh environments (oper-
ating ambient temperature:
−
30
°
C to 70
°
C)
E3X-NA
@
(V)
3.0-mm dia.
(0.2-mm dia.)
E3X-NAG
@
E3X-NA
@
F
3.0-mm dia.
(0.7-mm dia.)
Teflon *1; withstands
chemicals and harsh
environments (operating
ambient temperature:
−
40
°
C to 200
°
C)
E3X-NA
@
(V)
1.0-mm dia.
(0.2-mm dia.)
E32-T81F
10 mm
E3X-NA
@
F
1.0-mm dia.
(0.5-mm dia.)
Heat-
resistant
Resists 200
°
C;
flexible (R10); fiber sheath
material: Teflon *1 (operat-
ing ambient temperature:
−
40
°
C to 200
°
C)
E3X-NA
@
(V)
1.0-mm dia.
(0.2-mm dia.)
E32-T81R
10 mm
E3X-NA
@
F
1.0-mm dia.
(0.5-mm dia.)
Resists
150
°
C *2;
fiber sheath
material: fluororesin (oper-
ating ambient temperature:
−
40
°
C to 150
°
C)
E3X-NA
@
(V)
1.5-mm dia.
(0.03-mm dia.)
35 mm
E3X-NA
@
F
1.5-mm dia.
(1.0-mm dia.)
Resists 300
°
C *3, with
spiral tube; high mechani-
cal strength; fiber sheath
material: stainless steel
(operating ambient temper-
ature:
−
40
°
C to 300
°
C)
E3X-NA
@
(V)
1.0-mm dia.
(0.03-mm dia.)
E32-T61
25 mm
E3X-NA
@
F
1.0-mm dia.
(0.5-mm dia.)
Side-view;
resists 150
°
C
*2; suitable
for detecting minute
sensing targets; fiber
sheath material: fluororesin
(operating ambient temper-
ature:
−
40
°
C to 150
°
C)
E3X-NA
@
(V)
1.0-mm dia.
(0.03-mm dia.)
35 mm
E3X-NA
@
F
1.0-mm dia.
(0.3-mm dia.)
Resists 200
°
C *3;
L-shaped; fiber sheath
material: stainless steel
E3X-NA
@
(V)
1.7-mm dia.
(0.03-mm dia.)
E32-T84S
25 mm
E3X-NA
@
F
1.7-mm dia.
(0.4-mm dia.)
Slot
sensor
Suitable for
film sheet
detection; no
optical axis adjustment
required; easy to mount
E3X-NA
@
(V)
4.0-mm dia.
(0.1-mm dia.)
25 mm
E3X-NAG
@
E3X-NA
@
F
4.0-mm dia.
(1.0-mm dia.)
Narrow
vision field
Suitable for
detecting
wafers
E3X-NA
@
(V)
1.7-mm dia.
(0.5-mm dia.)
10 mm
E3X-NA
@
F
Side-view;
suitable for
detecting
wafers
E3X-NA
@
(V)
2.0-mm dia.
(0.03-mm dia.)
E3X-NA
@
F
2.0-mm dia.
(0.5-mm dia.)
Application
Features
Appearance
Applicable
Amplifier Unit
Sensing distance (mm)
(Values in parentheses: when
using the E39-F1 Lens Unit)
Standard object
(see notes)
(min. sensing
target: opaque)
Part
number
Permissible
bending
radius
Free-cut
5-mm dia.
E32-T12F
300
480
Free-cut
5-mm dia.
200
E32-T14F
37
60
6-mm dia.
350
100
M4 screw
180
50
Free-cut
M4 screw
400
E32-T51
120
M4 screw
300 (3,000)
90
Free-cut
2-mm dia.
130
E32-T54
35
3-mm dia.
700
210
Free-cut
10
E32-G14
10
10
Free-cut
3-mm dia.
1,000
E32-T22S
300
Free-cut
3.5 mm dia. x 3
700
E32-T24S
210
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