Troubleshooting and Maintenance
5-8
9161-A2-GH30-20
September 1997
Test Jacks
The T1 NAM and Dual DSX APM provide four sets of test jacks, which are
located on the upper section of the faceplate. Four nonintrusive access points are
also provided.
The following figure is an example of using these test jacks:
DSX OUT to allow test equipment to terminate the signal coming from
equipment (e.g., a PBX) attached to the DSX port on the rear of the T1
access unit.
DSX IN to allow test equipment to provide a signal to equipment (e.g., a PBX)
attached to the DSX port on the rear of the T1 access unit.
T1 Access Unit
Internal
Circuitry
PBX
Test
Equipment
Front
Rear
Out
In
Out
In
97-15682
Test
Equipment
The following figure is an example of using the monitor test jacks:
DSX MON IN to allow test equipment to nonintrusively monitor the signal
being sent from the T1 access unit to equipment (e.g., a PBX) attached to the
DSX port on the rear of the T1 access unit.
DSX MON OUT to allow test equipment to nonintrusively monitor the signal
being sent equipment (e.g., a PBX) attached to the DSX port on the rear of
the T1 access unit.
T1 Access Unit
Internal
Circuitry
Test
Equipment
Front
Rear
Mon In
Mon Out
Rx
Rx
Test
Equipment
PBX
97-15680
