GRL-PCIE5-CEM-RXA User Guide and MOI
Rev7.0
© Granite River Labs 2022 Version 7.0, June 2022. Updated 06.29.2022
Page 78 of 123
8.1.13
EH/EW Calibration Adjustment
The following Eye Height/Eye Width calibration procedure applies for PCIe Gen 5:
Set ISI Trace to 37 dB (physical loss of 25.5 to 28.5 dB for the System Board and 29.8 to 32.8 dB for
the Add-In Card).
The goal is to calibrate final eye to achieve the following targets:
•
Eye Width: 8.875 to 9.875 ps
•
Eye Height: 13.5 to 16.5 mV
Capture seven waveforms for each condition on the Scope and analyze Eye Height/Eye Width
using SigTest. Set up the following parameters.
a)
BERT Settings:
•
General Output: ON
•
Select SI-PPG and Emphasis tab- Emphasis Function: ON
•
Select the Pattern tab- Test Pattern: 128b130b_CP_L0_Gen5_P0
•
Set all Jitter, Noise, and Amplitude values.
•
Save seven waveforms and read in SigTest.
•
Determine the Optimized Preset and CTLE as follows:
o
Start Preset 5 on BERT and capture seven waveforms.
o
Measure all the seven waveforms for all CTLE
’s
ranging from -5.0 to -15 dB using
SigTest and repeat measurements for P5, P6, P8 and P9. For each CTLE and Preset
combination, calculate EW/EH through averaging after filtering the outliers (see
below):
▪
The waveform is considered an outlier if the Eye Width is < 1.0 ps or deviates
from the median by 2.0 ps.
▪
The waveform is considered an outlier if the Eye Height is < 1.0 mV or
deviates from the median by 5.0 mV.
