29
DEX-P9,P9R
4
CH1:RFO
0.5V/div.
Play
0.5
µ
s/div.
9
CH1:SINY 100mV/div.
Play
200ms/div.
6
CH1:FEY
500mV/div.
7
CH2:FD
500mV/div.
4
CH3:RFO
1V/div.
Setup(FE Bias adjustment)
10
m
s/div.
5
CH1:TEY
500mV/div.
)
CH2:CIN
500mV/div.
Search
200ms/div.
4
CH1:RFO
1V/div.
5
CH2:TEY
500mV/div.
#
CH3:TD
1V/div.
Test mode 1TRjump
500
µ
s/div.
5ms/div.
4
CH1:RFO
2V/div.
(
CH2:
dfct
5V/div.
7
CH3:FD
1V/div.
#
CH4:TD
2V/div.
Play(The defect part passes)
500
µ
s/div.
4
CH1:RFO
1V/div.
5
CH2:TEY
1V/div.
#
CH3:TD
1V/div.
Test mode 32TRjump
5ms/div.
4
CH1:RFO
1V/div.
5
CH2:TEY
500mV/div.
(
CH3:
dfct
5V/div.
CRG move
50
µ
s/div.
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
VREF
→
6
CH1:FEY
500mV/div.
7
CH2:FD
500mV/div.
5
CH3:TEY
500mV/div.
#
CH4:TD
500mV/div.
Play
1ms/div.
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