18
Rockwell Automation Publication 1441-UM002A-EN-P - May 2011
Chapter 2
Bump Test Extension Module
6.
Press F2 (Save) to name and save the current settings for future recall.
7.
Press F3 (Start) to begin collecting data.
The Bump Test – Taking Data screen appears.
Lines
Specify the measurement lines of
resolution.
The increased resolution requires
increased time for data collection
and consumes more storage
memory.
400 (default)
100, 200, 400, 800, 1600, 3200,
6400, 12800, 25600
Avg. Type
Specify the Peak Hold averaging.
The data collector holds the
highest spectral peak for each
hammer hit.
For exponential averaging, the
data collector averages multiple
hits to minimize the noise level;
however you must pause the
averaging process after the last
hit.
Pk Hold
Exponential (default)
Display Y-axis
Specify the type of y-axis scaling.
Typically set to Linear.
Linear (default)
Logarithmic
Logarithmic dB
Table 2 - Bump Test Parameter Descriptions
Parameter
Description
Value