4-58 SEL
OGIC
Control Equations
Date Code
20060731
SEL-300G Instruction Manual
Self-Test Condition Limits
Protection
Disabled
ALARM
Output Description
ROM
Failure
checksum
Yes
Latched
Performs a checksum test
on the relay program
memory every 10
seconds.
A/D
Failure
Yes
Latched
Validates proper number
of conversions each 1/4
cycle.
CR_RAM
Failure
checksum
Yes
Latched
Performs a checksum test
on the active copy of the
relay settings every 10
seconds.
EEPROM
Failure
checksum
Yes
Latched
Performs a checksum test
on the nonvolatile copy of
the relay settings every 10
seconds.
The following self-tests are performed by dedicated circuitry in the microprocessor and the
SEL-300G main board. Failures in these tests shut down the microprocessor and are not shown
in the STATUS report.
Micro-
processor
Crystal
Failure
Yes
Latched
The relay monitors the
microprocessor crystal. If
the crystal fails, the relay
displays “CLOCK
STOPPED” on the LCD
display. The test runs
continuously.
Micro-
processor
Failure
Yes Latched
The
microprocessor
examines each program
instruction, memory
access, and interrupt. The
relay displays “VECTOR
nn” on the LCD upon
detection of an invalid
instruction, memory
access, or spurious
interrupt. The test runs
continuously.
Summary of Contents for SEL-300G
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