Copyright © Siemens AG 2016. All rights reserved
320
ERTEC 200P-2 Manual
Technical data subject to change
Version 1.0
0
UARTRXD
0h
rh w value of the UARTRXD primary input.
1
SIRIN
0h
rh w value of the SIRIN primary input.
2
nUARTDSR
0h
rh w value of the nUARTDSR primary input.
3
nUARTCTS
0h
rh w value of the nUARTCTS primary input.
4
nUARTDCD
0h
rh w value of the nUARTDCD primary input.
5
nUARTRI
0h
rh w value of the nUARTRI primary input.
6
UARTRXDMACLR
0h
rh w
Writes to this bit specify the value to
be driven on the intra-chip input,
UARTRXDMACLR, in the integration
test mode.
Reads return the value of
UARTRXDMACLR at the output of the
test multiplexor.
7
UARTTXDMACLR
0h
rh w
Writes to this bit specify the value to
be driven on the intra-chip input,
UARTTXDMACLR, in the integration
test mode.
Reads return the value of
UARTTXDMACLR at the output of the
test multiplexor.
31dt8 <unused>
000000h r
Reserved, unpredictable when read.
Register:
UARTITOP
Address:
88h
Bits:
31dt0
Reset value:
0h
Attributes: r(h) (w)
Description:
Integration test output read/set register
(for integration test)
Bit
Identifier
Reset
Attr.
Function / Description
0
UARTTXD
0h
rh w
Writes specify the value to be driven
on the UARTTXD line in the integration
test mode.
1
nSIROUT
0h
rh w
Writes specify the value to be driven
on the nSIROUT line in the integration
test mode.
2
nUARTDTR
0h
rh w
Writes specify the value to be driven
on the nUARTDTR line in the integra-
tion test mode.
3
nUARTRTS
0h
rh w
Writes specify the value to be driven
on the nUARTRTS line in the integra-
tion test mode.
4
nUARTOut1
0h
rh w Writes specify the value to be driven