Copyright © Siemens AG 2016. All rights reserved
486
ERTEC 200P-2 Manual
Technical data subject to change
Version
1.0
The following level translation circuit is recommended
by using of GPIOs
(see chapter
2.3.10.9.21). Comparator should be placed near transceiver. The 3,3V supply voltage
tolerance for
POF transceiver
is limited to
+- 5%
.
Figure 57: SD level translation circuit
4.7 Wiring of pins not used
The following applies in general:
IN and INOUT pins that do
not
have an internal pull resistor must be connected to
an external pull resistor.
If the internal pull-up/pull-down resistor of the GPIOs is
deactivated
, it must be ac-
tivated with the SW or an external pull-up/pull-down resistor is to be connected.
For wiring PHY pins that are not used, see xxx
Signal
Signal description
Dir
Function description
Ball
ATP
Analog Test Function
out Analog Test
Enable to monitor or drive specific nodes in the
analog circuit during analog test. For debugging
purposes it is recommended to have this pin ac-
cessable for an oscilloscope on a PCB. This pin is
not used in normal operation.
K18
TEST
IC-Test-Mode
in
IC Test Mode
Select signal for ASIC test.
For normal operation this pin must be connected by a
1k Ohm Pull down resistor to GND.
R9
TMC1
Testmode_1
in
Test Mode Control
Signal for ASIC test.
For normal operation this pin must be connected
directly to GND.
F12
TMC2
Testmode_2
in
Test Mode Control
Signal for ASIC test.
For normal operation this pin must be connected
directly to GND.
R14
TACT
TESTACT-TAP-RESET
in
Special Test Mode TAP Controller
Used for Boundary scan test.
For normal operation this pin must be connected by a
1k Ohm Pull down resistor to GND.
R12
TAP_SEL
TAP Select
in
TAP
Select
T7