Blocks and Their Functions
S5-95F
Execution Times of FB252
Table 9-11. Execution Times of FB252
Test Component
Parameter AUFT
Execution Times
CPU
00
H
approx. 87 ms
Operating system
comparison
01
H
approx. 20 s
Due to its long execution time, the test can be called
only with parameter EINZ = 1
RAM with STEP 5 objects
02
H
approx. 2.8 ms per STEP 5 statement
Onboard DI
03
H
approx. 97 ms
Onboard DQ
04
H
approx. 230 ms
Onboard interrupt DI
05
H
approx. 68 ms
Onboard counters
06
H
95 ms for one counter, 190 ms for 2 counters
External I/Os, DI
07
H
500 ms to 800 ms depending on configuration of LAN
External I/Os, DQ
08
H
500 ms to 800 ms depending on configuration of LAN
Processor RAM
09
H
max. 5 ms
Memory submodule
0A
H
max. 5 ms
Power failure routine
0B
H
max. 5 ms
Scan time monitor
0C
H
approx. 800 ms
Load voltage failure
routine
0D
H
max. 5 ms
Logical program counter
0E
H
max. 5 ms
Short-circuit test
0F
H
For onboard DI:
12 ms per test DQ
For at least one external DI:
19 ms per test DQ
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a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a
a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a a
Example:
Execution of Short-Circuit Test
Test digital input DI 32.3 via digital output DQ 33.2 for short circuit. You have
programmed this circuit with COM 95F. You will find the following entry in DB1:
KT
DQ 33.2
32.3;
(DQ 33.2 tests DI 32.3)
You store the condition for calling the short-circuit test in flag 10.0. Flag 10.6 = 1 and
flag 10.7 = 0.
9-20
EWA 4NEB 812 6210-02