S5-95F
Installing and Connecting the Basic System
Monitoring the Connection of Failsafe Onboard DI with Two-Channel Sensor via Check DQ
(Type E)
A conductor-to-conductor short circuit between the sensor lines of S1a and S1b can (physically) not
occur, since both lines are laid separately. Therefore, both sensor lines can be monitored by the
same check DQ.
Figure 4-11. Connection of a Check DQ for Short-Circuit Test, Two-Channel Sensor
a a a a a a
a a a a a a
a a a a a a
a a a a a a
OUT
a a a
a a a
a a a
2
a a a
a a a
a a a
4
a a a
a a a
a a a
a a a
6
a a a
a a a
a a a
8
a a a a
a a a a
a a a a
11
a a a a
a a a a
a a a a
a a a a
13
a a a a
a a a a
a a a a
a a a a
15
a a a a
a a a a
a a a a
16
a a a a
a a a a
a a a a
18
a a a a
a a a a
a a a a
19
a a a
a a a
a a a
1
a a a
a a a
a a a
3
a a a
a a a
a a a
5
a a a
a a a
a a a
a a a
7
a a a
a a a
a a a
9
a a a a
a a a a
a a a a
10
a a a a
a a a a
a a a a
12
a a a a
a a a a
a a a a
a a a a
14
a a a a
a a a a
a a a a
17
a a a a
a a a a
a a a a
20
a a a a
a a a a
a a a a
10
a a a a
a a a a
a a a a
a a a a
13
a a a a
a a a a
a a a a
a a a a
14
a a a a
a a a a
a a a a
16
a a a a
a a a a
a a a a
17
a a a a
a a a a
a a a a
19
a a a a
a a a a
a a a a
11
a a a
a a a
a a a
1
a a a
a a a
a a a
2
a a a
a a a
a a a
3
a a a
a a a
a a a
4
a a a
a a a
a a a
5
a a a
a a a
a a a
a a a
6
a a a
a a a
a a a
a a a
7
a a a
a a a
a a a
8
a a a
a a a
a a a
9
a a a a
a a a a
a a a a
12
a a a a
a a a a
a a a a
a a a a
15
a a a a
a a a a
a a a a
18
a a a a
a a a a
a a a a
20
Subunit A
a a a a
a a a a
a a a a
a a a a
IN
a a a a a
a a a a a
a a a a a
a a a a a
a a a a a
L+
a a a
a a a
a a a
a a a
a a a
L
-
a a a a a a a a
a a a a a a a a
a a a a a a a a
a a a a a a a a
a a a a a a a a
DI 32.2
a a a a a
a a a a a
a a a a a
a a a a a
a a a a a
L+
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
24 V DC
a a a a
a a a a
a a a a
a a a a
L
-
a a a
a a a
a a a
2
a a a
a a a
a a a
4
a a a
a a a
a a a
a a a
6
a a a
a a a
a a a
8
a a a a
a a a a
a a a a
11
a a a a
a a a a
a a a a
a a a a
13
a a a a
a a a a
a a a a
a a a a
15
a a a a
a a a a
a a a a
16
a a a a
a a a a
a a a a
18
a a a a
a a a a
a a a a
19
a a a
a a a
a a a
1
a a a
a a a
a a a
3
a a a
a a a
a a a
5
a a a
a a a
a a a
a a a
7
a a a
a a a
a a a
9
a a a a
a a a a
a a a a
10
a a a a
a a a a
a a a a
12
a a a a
a a a a
a a a a
a a a a
14
a a a a
a a a a
a a a a
17
a a a a
a a a a
a a a a
20
a a a a
a a a a
a a a a
10
a a a a
a a a a
a a a a
a a a a
13
a a a a
a a a a
a a a a
a a a a
14
a a a a
a a a a
a a a a
16
a a a a
a a a a
a a a a
17
a a a a
a a a a
a a a a
19
a a a a
a a a a
a a a a
11
a a a
a a a
a a a
1
a a a
a a a
a a a
2
a a a
a a a
a a a
3
a a a
a a a
a a a
4
a a a
a a a
a a a
5
a a a
a a a
a a a
a a a
6
a a a
a a a
a a a
a a a
7
a a a
a a a
a a a
8
a a a
a a a
a a a
9
a a a a
a a a a
a a a a
12
a a a a
a a a a
a a a a
a a a a
15
a a a a
a a a a
a a a a
18
a a a a
a a a a
a a a a
20
Subunit B
a a a a a a
a a a a a a
a a a a a a
a a a a a a
a a a a a a
OUT
a a a a
a a a a
a a a a
a a a a
a a a a
IN
a a a a
a a a a
a a a a
a a a a
a a a a
L+
a a a
a a a
a a a
a a a
a a a
L
-
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
DI 32.2
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
a a a a a a a a a
DQ 33.1
a a a a
a a a a
a a a a
a a a a
a a a a
L
-
a a a a a
a a a a a
a a a a a
a a a a a
L+
a a a a a
a a a a a
a a a a a
a a a a a
a a a a a
S1a
a a a a a a
a a a a a a
a a a a a a
a a a a a a
a a a a a a
S1b
a a a a a a a a a a a a a a a a a a a a
a a a a a a a a a a a a a a a a a a a a
a a a a a a a a a a a a a a a a a a a a
a a a a a a a a a a a a a a a a a a a a
Two-channel sensor
Requirements on Sensors for Failsafe Digital Inputs
Please refer to section 18.8.
How to Program Check DQs for Short-Circuit Test in DB1
In DB1, you program which digital inputs you supply via check DQs.
EWA 4NEB 812 6210-02
4-13