SNA5000A Vector Network Analyzer User Manual 134
5.8.5
Eye Diagram Scale Management
By default, the eye diagram is displayed in the automatic scale settings, which show the
details as clearly as possible. They can also be manually changed.
The scale settings in the vertical axis can be changed manually. But those in the
horizontal axis depend on the data rate of the input signal, which can't be changed after the
simulation starts.
To switch to a scale setting mode, click the
Auto Scale
or
Manual
radio button in the
Scale/Mask
bar.
To change the scale or offset values in
Manual
scale mode, set the value in the
Scale/Div
or
Offset
textbox. The
Offset
value here is the value that the center vertical scale
line refers to.
5.8.6
Mask Test for Eye Diagram
Mask patterns are some areas where the eye diagram is forbidden to pass, which
transfer the design requirements of the transmission systems into the numerical
characteristics of eye diagrams. They usually rule the tolerance of logic 0,1 level and rise or
fall time. If the eye diagram passes through the areas, the TDR option judges that the eye
diagram can't meet the requirement, leading to the failure of the mask test. According to
different communication standards, or at the different nodes in a communication system,
different mask patterns should be applied. The first step to mask test is to select or design a
suitable mask pattern based on the requirements.
To select or change the mask pattern applied, click the
Mask Pattern
button in the
Scale/Mask
bar to open the
Mask Pattern
dialog.
In the
File
tab of the dialog, preinstalled standard patterns or user-defined mask files
(.MSK format) can be loaded. In the
Scale
tab, the
Margin
of the mask, start
Position
of a
bit,
Delta
time of a bit, and
Logic Level
can be set in textboxes. In the
Edit
tab, the positions
of vertices in the mask pattern can be changed by set values in the textboxes. Dragging the
vertices in the left window also makes sense, but it's recommended to drag with a mouse
connected to the VNA, because the points may be too close together for easy entry using
touch operation.
Close the dialog after saving the modifications to a mask file, the new pattern will be
applied to the next mask test.
To switch on or off the mask test, click the
Mask Test
checkbox in the
Scale/Mask
bar.
5.8.7
Jitter & Statistical Eye Diagram
Jitter is the transient deviation from the corresponding ideal position of a signal over
successive trigger events. High jitter worsens the transmission performance. It's divided into
the Deterministic Jitter (DJ) and the Random Jitter (RJ). RJ is generated by some
unpredictable factors and is independent of the input bit patterns. The models for RJ usually
have a Gaussian distribution, and the magnitudes are represented in root mean square
(RMS) values. DJ is generated by some repeatable and predictable factors and usually has a
finite magnitude value. The jitter related to the input bit patterns in DJ is called the Data
Dependent Jitter (DDJ), while the other jitter in DJ is called the Periodic Jitter (PJ).
Summary of Contents for SNA5000A Series
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