— 61 —
Function
TSTIN6
TSTIN7
MUTI
VDD
GND
DOUT
DIN
XSEL
PSEL
EPCK
EYEI
EYEQ
BTR
ELB
C9M
TSTIN8
GND
IDST
IDCK
IDO
WINGT
SYST0
SYST1
ADST0
ADST1
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
I
I
I
–
–
O
I
I
I
O
O
O
O
O
O
I
–
O
O
O
O
O
O
O
O
Function
Pin No.
Pin Name
I/O
For testing IC (Fixed at “L”)
Muting input. Muted at “H”
Power supply (+5V)
Ground
QPSK inverted output (Not used)
QPSK signal input
Crystal select. Used at “H” (Fixed at “H”)
PLL select. Used at “L” (Fixed at “L”)
QPSK eye pattern clock. 288 kHz (Not used)
Eye pattern output. I phase (Not used)
Eye pattern output. Q phase (Not used)
Not used
9.216 MHz (Not used)
For testing IC (Not used)
Ground
Signal indicating ID start position (Not used)
ID signal sample clock
Data changes at falling edge of clock. 576 kHz (Not used)
ID data output (MSB first) (Not used)
“L” while searching for sync signal of correction block (Not used)
Displays lock state of sync signal of correction block (Not used)
Displays continuous state of ID address of correction block (Not used)
Summary of Contents for SDP-EP9ES
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