5
Performance Checks
Test Procedures
5-21
Arbitrary Waveform
Memory Operation
This tests the integrity of the waveform memory. The waveform
memory stores the waveforms that are being generated at the output
connector and therefore, flaws in the memory can cause distortions
and impurity of the output waveforms.
Waveform memory
Equipment: Distortion Analyzer, ArbConnection
Preparation:
1. Connect 5251 output to the distortion analyzer input. Configure
the 5251 as follows:
SCLK:
As required by the test
Waveform: Arbitrary
Amplitude: 5
V
Output: On
2. Using ArbConnection prepare and download the following
waveform:
Wavelength:
2 M points
Waveform: Sine
wave
SCLK 200
MS/s
Test Procedure:
1. Perform Sine wave distortion. It should be less than 0.1 %
Test Results
Pass
Fail
Modulated
Waveforms
Operation
This tests the operation of the modulation circuits. It includes tests for
the various modulation functions: FM, AM, FSK, PSK, Frequency hops
and Sweep. Since the run modes are common to all modulation
functions, they are being tested on the FM function only.
FM - Standard
Waveforms
Equipment: Oscilloscope
Preparation:
1. Configure the oscilloscope as follows:
Time Base:
50
μ
s
Sampling Rate: 50 MS/s at least.
Trace A View:
Jitter, Type: FREQ, CLK.
Trigger source: Channel 2, positive slope
Amplitude:
1 V/div
2. Connect the 5251 output to the oscilloscope input, channel 1
3. Connect the 5251 SYNC output to the oscilloscope input,
channel 2
Summary of Contents for 5251
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