Test Summary
2
Test Summary
This procedure describes one test configuration of the HPA759 evaluation board for bench evaluation.
2.1
Definitions
The following naming conventions are followed.
VXXX :
External voltage supply name (VADP, VBT, VSBT)
LOADW:
External load name (LOADR, LOADI)
V(TPyyy):
Voltage at internal test point TPyyy. For example, V(TP12) means the voltage at
TP12.
V(Jxx):
Voltage at header Jxx
V(TP(XXX)):
Voltage at test point XXX. For example, V(ACDET) means the voltage at the test
point which is marked as ACDET.
V(XXX, YYY):
Voltage across point XXX and YYY.
I(JXX(YYY)):
Current going out from the YYY terminal of header XX.
Jxx(BBB):
Terminal or pin BBB of header xx.
JPx ON :
Internal jumper Jxx terminals are shorted.
JPx OFF:
Internal jumper Jxx terminals are open.
JPx (-YY-)
ON: Internal jumper Jxx adjacent terminals marked as YY are shorted.
Measure:
→
A, B
Check specified parameters A, B. If measured values are not within specified limits,
the unit under test has failed.
Observe
→
A, B
Observe if A, B occur. If they do not occur, the unit under test has failed.
Assembly drawings have locations for jumpers, test points, and individual components.
7
SLUU916 – April 2012
WCSP-Packaged bq24272/273 Evaluation Modules
Copyright © 2012, Texas Instruments Incorporated