261
6
F
2
S
0
8
5
0
Element Signal
number
OCI-A 68
OCI-B 69
OCI-C 70
EFI 72
Fix the time characteristic to test by setting the scheme switch MEFI or MOCI on the "Scheme
switch" screen.
"Setting (change)" sub-menu
→
"Protection" screen
→
"Trip" screen
→
"Scheme switch" screen
The test procedure is as follows:
•
Press 5 (=Logic circuit) on the "Test" screen to display the "Logic circuit" screen.
•
Enter a signal number to observe the OCI or EFI output at monitoring jack A and press the
ENTER key.
•
Apply a test current and measure the operating time. The magnitude of the test current should
be between 1.2
×
Is to 20
×
Is, where Is is the current setting.
•
Calculate the theoretical operating time using the characteristic equations shown in Section
2.16.6. Check that the measured operating time is within IEC 60255-3 class 5 for standard,
very and long-time inverse or IEC 60255-3 class 7.5 for extremely inverse.
6.5.1.7 Thermal overload element THM-A and THM-T
The testing circuit is same as the circuit shown in Figure 6.5.1.8.
The output signal of testing element is assigned to the monitoring jack A.
The output signal numbers of the elements are as follows:
Element Signal
No.
THM-A 367
THM-T
363
To test easily the thermal overload element, the scheme switch [THMRST] in the "Switch"
screen on the "Test" menu is used.
•
Set the scheme switch [THMRST] to "ON".
•
Enter the signal number to observe the operation at the monitoring jack A as shown in
Section 6.5.1.
•
Apply a test current and measure the operating time. The magnitude of the test current should
be between 1.2
×
Is to 10
×
Is, where Is is the current setting.
CAUTION
After the setting of a test current, apply the test current after checking that the THM% has
become 0 on the "Metering" screen.
•
Calculate the theoretical operating time using the characteristic equations shown in Section
2.8. Check that the measured operating time is within 5%.
6.5.1.8 Broken
conductor detection element BCD
The testing circuit is shown in Figure 6.5.1.9.
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