<fig id=MMS\5200\52003_25.TIF>Page 3-25</fig>
Subtest 04 Cross talk & peak shift
This subtest writes the eight types of worst pattern data
(shown below) that is shifted cylinder by cylinder then
reads the data out and compares it to the original data.
Worst pattern data
1. B5ADAD
2. 4A5252
3. EB6DB6
4. 149249
5. 63B63B
6. 9C49C4
7. 2DB6DB
8. D24924
Subtest 05 Write/Read/Compare (CE)
This subtest writes B5ADADH worst pattern data to the CE
cylinder and then reads the data out and compares it with
the original data.
Subtest 06 Write specified address
This subtest writes specified data to a specified
cylinder and head.
Subtest 07 Read specified address
This subtest reads data which has been written to
a specified cylinder and head.
Subtest 08 ECC circuit (CE cylinder)
This subtest checks the ECC (Error check and correction)
circuit functions to a specified cylinder and head.
Subtest 09 Sequential write
This subtest writes specified data of the two bytes
to all cylinder.
Subtest 10 W-R-C specified address
This subtest writes specified data to the specified
cylinder and head, then read and compare with original
data.
~~
DOC:MAINTENANCE MANUAL
MODEL:T5200
MODEL:T5200C
CHAP:3 TESTS AND DIAGNOSTICS
SECT:3.12, REAL TIMER TEST
DOC_ID:3.12 T5200