Model SMM 770 Scanning Magnetic Microscope System
TRISTAN TECHNOLOGIES --Page
26
76 micron wire spacing
400 micron liftoff
5.E-06
5.E-06
6.E-06
6.E-06
7.E-06
7.E-06
8.E-06
-2
-1.5
-1
-0.5
0
0.5
1
1.5
2
Horizontal scan (mm)
Inducti
on fi
el
d (nT)
Scan Data
Theoretical
Figure 3-7:
Horizontal Scan of parallel wires 0.003" apart.
The above theoretical line is derived from a best fit to the gap between the SQUID and the
wire source. This result is verified by successive horizontal scans at increasing liftoffs, and
a pair of vertical scans of two sets of parallel wires. The vertical scan plots illustrate the
position of the SQUID probe tip and the gap to the Sapphire window.
229 micron wire spacing
-2.00E-06 T
-1.00E-06 T
0.00E+00 T
1.00E-06 T
2.00E-06 T
3.00E-06 T
4.00E-06 T
5.00E-06 T
6.00E-06 T
-2 mm
-1.5 mm
-1 mm
-0.5 mm
0 mm
0.5 mm
1 mm
1.5 mm
2 mm
25um data
25um calculated
100um data
100um calculated
200um data
200um calculated
400um data
400um calculated
Figure 3-8:
Horizontal scans at increasing liftoffs to parallel wires 0.009” apart.
