N-Lite Option
F-1
F
N-L
ITE
O
PTION
NOTE –
N
-Lite is a purchased option that must be installed in your system before you can
open and analyze a Dektak 150 2D scan as described in this appendix.
ABOUT THE
N
-LITE OPTION
The
N
-Lite Low Inertia Sensor (LIS) 3 Option allows stylus-to-surface engagement for ultra-low-
force profiling. The sensor enables the stylus force to be adjusted down to 0.03 mg for measuring
very soft films or when using an extremely sharp, sub-micron stylus to measure sub-micron lines and
trenches. Servo control suspends the stylus in a free-floating state, maintaining constant force, even
over long steps.
The above functions mean that you can make scratch-free measurements of resists, polymers, and
soft metals such as gold. High-aspect-ratio, super-sharp, 50
μ
m styli reach into 10µm deep by 2µm
wide trenches. Such styli enable the accurate measurement of Shallow Trench Isolation (STI) etch
depth and the characterization of deep structures for MEMS.
The
N
-Lite LIS 3 Option includes the following features:
•
Low force servoed sample engage
•
Automatic invocation of
N
-Lite for scans at less than 3mg stylus force
•
Reduced-force pre-scan stylus touchdown
•
Minimal stylus tip drag—"gore zone"
•
No impact on Dektak 150 user interface
•
Accurate measurement force (± 20
μ
g
)
•
Vertical positioning accuracy: ± 0.20µm
•
Automatic "minimal force" calibration
Summary of Contents for Dektak 150
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