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Spatial Comparison
Spatial Comparison is a quantitative comparison between two Spatial Scans that is
generated by subtracting the values of the first scan (Test View) from the values of the
second scan (Reference View) cell by cell. The Spatial Comparison node allows you to see
the difference between two Spatial Scans at the same frequency.
You can use this feature to for example, find the failure point position in a production circuit
board after a spectral difference has pinpointed a frequency that is significantly different
between the two PCBs. This is useful for repairing faulty boards or pinpointing manufacturing
process problems Two Spatial Scans that will compared must have overlapping cells. Add
Spatial Comparison node to Project node. Node settings window automatically opens. After
you click OK, Compare Spatial window opens.