OPERATION
Carl Zeiss
Illumination and contrast methods
Axio Imager
170
430000-7344-001
M70-2-0020 e 06/2009
4.9.8
Setting reflected-light darkfield
(1) Application
The incident light darkfield technique is used to examine specimens that do not only have reflective
surfaces of different reflectivity (ideal brightfield objects), but feature scratches, cracks, pores, or in a
nutshell, deviations in plane surfaces. All these light-scattering details shine brightly in the darkfield whilst
the reflective plane surfaces stay dark.
(2) Instrument
equipment
−
Axio Imager MAT with connected and adjusted HAL 100 halogen illuminator.
−
Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan objectives additionally labeled with "HD".
−
Reflector module DF P&C, 6x20 compensator mount with darkfield stop for reflected light (424706-
0000-000) or 4-position modulator turret
(3) Setting
reflected-light
darkfield
•
Prepare the microscope as described in Section 4.9.7 for reflected-light brightfield. The luminous-field
diaphragm should just disappear from the field of view to avoid reflections.
•
Rotate the reflector turret to move the DF P&C reflector module into the light path.
•
When using the 6x20 compensator mount, remove the 6x20 slider, if necessary. When using the
4-position modulator turret, set position
H/D
.
•
Rotate the nosepiece to swing in the darkfield objective (HD).
•
Fully open the aperture diaphragm and remove any neutral-density filter from the light path.
•
Place the specimen on the stage and focus on it.
