OPERATION
ZEISS
Illumination and contrast methods in reflected light
Axiolab 5
114
430037-7444-001
05/2019
4.3.2
Configuring reflected light darkfield microscopy
(1) Application
Reflected light darkfield microscopy is used for examining incompletely reflecting surfaces with different
degrees of reflectivity (ideal reflected light brightfield specimens), i.e. with scratches, ruptures, pores or
other disruptions to the even surface. All these light-scattering details light up brightly in the darkfield,
whereas the even surface remains dark.
(2) Instrumentation
Observations in the reflected light darkfield can be made only on Axiolab 5 microscopes for reflected
light.
−
Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan objectives with the additional designation “HD”
−
ACR P&C darkfield reflector module for reflected light
NOTE
The stand for reflected light is equipped with a built-in darkfield stop.
(3) Configuring the reflected light darkfield
•
Adjust the microscope as described in section 4.3.1 for the reflected light brightfield. In order to avoid
reflexes, the displayed luminous-field aperture should be located slightly beyond the edge of the field
of view.
•
If used, remove the 6x20mm compensator.
•
Swivel in the objective position with the darkfield objective (HD) on the nosepiece.
•
If necessary, swivel in the darkfield reflector module on the reflector turret.
•
Completely open the aperture diaphragm and switch off or remove the neutral filter as necessary.
•
Place the specimen on the stage and sharpen the image.
