Functional Description
ARM DDI 0275D
Copyright © 2002, 2003 ARM Limited. All rights reserved.
2-11
2.7
BIST interface
ATPG testing can only test out the interface between the ETB11 RAM and the ETB11.
It is unable to find faults in the actual RAM. A
Built-In Self Test
(BIST) interface is
required that fully tests the RAM.
ATPG vectors are created using Synopsys TetraMax. These enable the shadow logic
around the ETB11 RAM to be tested provided that the TetraMax has access to a model
of the RAM used. Greater than 99% stuck-at fault coverage can be achieved.
A block diagram of the BIST interface is shown in Figure 2-4.
Figure 2-4 BIST interface block diagram
The
MTESTON
signal gives an external BIST controller access to the inputs and
outputs of the ETB11 RAM. It is not possible for the ETB11 to operate in functional
mode when the BIST is testing the RAM. When
MTESTON
is HIGH do not:
•
set the TraceCaptEn bit
•
write to the ETB11 RAM
•
read from the ETB11 RAM.
A
MBISTADDR
DIN
MBISTDIN
CS
MBISTCE
WE
MBISTWE
MTESTON
CLK
Etb11Int
MBISTDOUT
ETB11 RAM
A
DIN
CS
WE
CLK
DOUT
Summary of Contents for ETB11
Page 6: ...List of Tables vi Copyright 2002 2003 ARM Limited All rights reserved ARM DDI 0275D ...
Page 8: ...List of Figures viii Copyright 2002 2003 ARM Limited All rights reserved ARM DDI 0275D ...
Page 46: ...Functional Description 2 26 Copyright 2002 2003 ARM Limited All rights reserved ARM DDI 0275D ...
Page 70: ...Signal Descriptions A 6 Copyright 2002 2003 ARM Limited All rights reserved ARM DDI 0275D ...
Page 78: ...Glossary Glossary 4 Copyright 2002 2003 ARM Limited All rights reserved ARM DDI 0275D ...