S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-35
Example
result = gm(d, g, s, sub, vds, idlim, vgs, vgstep, iglim, &iflag)
Schematic
ibic1
This subroutine measures collector current (I
CE
) and base current (I
B
) and calculates beta (
) at a fixed collector
voltage (V
CE
), base voltage (V
BE
), and substrate bias (V
SUB
). The device is in the common-emitter configuration.
Usage
void ibic1(int
e
, int
b
, int
c
, int
sub
, double
vce
, double
vbe
, double
vsub
,
double
*ibe
, double
*ice
, double
*beta
)
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vce
Input
Forced collector voltage, in volts
vbe
Input
Forced base voltage, in volts
vsub
Input
The forced substrate bias, in volts
ibe
Output
Measured base current:
4.0E+21 = Current limit reached; measured current is within 98 %
of the 200 mA limit.
is returned as 0.0
ice
Output
Measured collector current:
4.0E+21 = Current limit reached; measured current is within 98 %
of the 200 mA limit.
is returned as 0.0
beta
Output
Current gain, collector current (I
C
) / base current (I
B
)
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
