UM11082
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© NXP B.V. 2018. All rights reserved.
User Manual
Rev. 1.1 — 12 January 2018
13 of 18
NXP Semiconductors
LPC8N04 Development Board
User Manual
Set up will vary between Development Tools, but the board debug probe should
supported as a CMSIS-DAP probe when using the on-board debug probe.
When using Keil MDK, install the Device Pack for the LPC8N04 (version 1.7 or later)
before attempting to use the board.
When using IAR EWARM, ensure that you have version 8.20.2 or later in order to have
LPC8N04 device family support.
3.4 Debugger firmware update (optional)
The MP board comes pre-programmed with a CMSIS-DAP firmware image; it is not
normally necessary to update the debugger firmware image, but this can be done by
following the steps below.
1. Download the LPC11U35 debug probe firmware from nxp.com (see Software and
Tools tab for the board: http://www.nxp.com/demoboard/OM40002.)
2. Place a jumper on P2.
3. Press and release the reset. Using File Explorer (or equivalent on Mac/Linux
platforms), look at the available drives on your system. A device called
CRP_DISABLED will appear.
4. Delete the firmware.bin file on the CRP_DISABLED drive.
5. Drag and drop the firmware.bin file you downloaded from nxp.com on to the
CRP_DISABLED drive.
6. Remove jumper on P2.
7. Repower the board.
8. The board should now enumerate on your system - allow 20-30 seconds for this to
complete.
4. Debug
Probe
The LPC11U35 debug probe on the LPC8N04 Development Board is pre-programmed
with firmware to support the CMSIS-DAP protocol. See
Section 3.4
for information on how
to update the debug probe firmware, if needed.
The an LED is connected to the LPC11U35 device. The behavior of the LEDs will vary
depending on firmware used, typically the LED will blink when debug communication is
occurring.
The SWD connections from the LPC8N04 target are routed to headers P4 and P6. If the
MP and DP boards are snapped apart, the P6 (MP side) and P5 (DP side) headers can be
populated with right angled connectors (not supplied) and reconnected, so that the debug
probe on the DP section can be used (or an external probe via the J1 connector), and
power provided to the MP section from the DP section.
