2-4
SeCTIon 2
Two-terminal Device Tests
For example, assume that you measured a leakage current of 25nA
with a test voltage of 100V . The leakage resistance is simply:
R =100/25nA = 4G
W
(4 × 10
9
W
)
2.4.3 Measurement Considerations
After the voltage is applied to the capacitor, the device must be
allowed to charge fully before the current measurement can be
made . Otherwise, an erroneous current, with a much higher
value, will be measured . The time period during which the capac-
itor charges is often termed the “soak” time . A typical soak time is
seven time constants, or 7RC, which would allow settling to less
than 0 .1% of final value . For example, if R is 1M
W
, and C is 1µF,
the recommended soak time is seven seconds . With small leakage
currents (<1nA), it may be necessary to use a fixed measurement
range instead of auto ranging .
2.4.4 example Program 2:
Capacitor Leakage Test
Program 2 performs the capacitor leakage test described above .
Follow the steps that follow to run the test using this program .
WARNING
Hazardous voltage may be present on the capacitor
leads after running this test. Discharge the capac-
itor before removing it from the test fixture.
With the power off, connect the instrument to the computer’s
1 .
IEEE-488 interface .
Connect the test fixture to the instrument using appropriate
2 .
cables .
Turn on the instrument, and allow the unit to warm up for
3 .
two hours for rated accuracy .
Turn on the computer and start Test Script Builder (TSB) . Once
4 .
the program has started, open a session by connecting to the
instrument . For details on how to use TSB, see the Series 2600
Reference Manual .
You can simply copy and paste the code from Appendix A in
5 .
this guide into the TSB script editing window (
Program 2
),
manually enter the code from the appendix, or import the TSP
file ‘
Cap_Leak.tsp
’ after downloading it to your PC .
If your computer is currently connected to the Internet, you
can click on this link to begin downloading:
http://www.
keithley.com/data?asset=50927
.
Discharge and install the capacitor being tested, along with
6 .
the series resistor, in the appropriate axial component sockets
of the test fixture .
WARNING
Care should be taken when discharging the capac-
itor, as the voltage present may represent a shock
hazard!
Now, we must send the code to the instrument . The simplest
7 .
method is to right-click in the open script window of TSB,
and select ‘
Run as TSP file
’ . This will compile the code and
place it in the volatile run-time memory of the instrument .
To store the program in non-volatile memory, see the “TSP
Programming Fundamentals” section of the Series 2600 Refer-
ence Manual .
Once the code has been placed in the instrument run-time
8 .
memory, we can run it at any time simply by calling the func-
tion ‘
Cap _ Leak()
’ . This can be done by typing the text
‘
Cap _ Leak()
’ after the active prompt in the Instrument
Console line of TSB .
In the program ‘
9 .
Cap_Leak.tsp
’, the function
Cap _
Leak(vsrc)
is created . The variable
vsrc
represents the
test voltage value applied to the device-under-test (DUT) . If
it is left blank, the function will use the default value given
to the variable, but you can specify what voltage is applied
by simply sending a voltage that is in-range in the function
call . As an example, if you wanted to source 100V, simply send
Cap _ Leak(100)
to the instrument .
The instrument will then source the programmed voltage and
10 .
measure the respective current through the capacitor . The
measured current leakage and calculated resistance value will
then be displayed in the Instrument Console window of TSB .
NOTE
The capacitor should be fully discharged before run-
ning the test . This can be accomplished by sourcing 0V
on the device for the soak time or by shorting the leads
together . Care should be taken because some capacitors
can hold a charge for a significant period of time and
could pose an electrocution risk .
The soak time, denoted in the code as the variable
l _ soak
,
has a default value of 10s . When entering the soak time, choose
a value of at least 7RC to allow settling to within 0 .1% of final
value . At very low currents (<500fA), a longer settling time may
be required to compensate for dielectric absorption, especially at
high voltages .
2.4.5 Typical Program 2 Results
As pointed out earlier, the exact value of leakage current will
depend on the capacitor value as well as the dielectric . A typical
value obtained for 1µF aluminum electrolytic capacitor was about
80nA at 25V .
Summary of Contents for Series 2600
Page 5: ......
Page 7: ......
Page 17: ...2 8 Section 2 Two terminal Device Tests...
Page 39: ...4 10 Section 4 FET Tests...
Page 53: ...6 4 Section 6 High Power Tests...
Page 130: ...A 77 Appendix A Scripts BJT_Comm_Emit_Vsb...
Page 136: ...Click below to find more Mipaper at www lcis com tw Mipaper at www lcis com tw...