Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-38
S530-907-01 Rev. A / September 2015
Example
result = icbo(e, b, c, sub, vcbo, vsub)
Schematic
iceo
This subroutine measures collector-emitter leakage at collector voltage (V
CE
) and substrate bias (V
SUB
).
Usage
double iceo(int
e
, int
b
, int
c
, int
sub
, double
vce
, double
vsub
)
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vce
Input
The forced collector-emitter voltage, in volts
vsub
Input
The forced substrate bias, in volts
Returns
Output
The measured leakage current
Details
This subroutine forces a V
CE
and V
SUB
and measures the leakage current. The base terminal is open
and the emitter is grounded.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
Source-measure units (SMUs)
SMU1: Forces
vce
, default current limit, measures
iceo
SMU2: Forces
vsub
, default current limit
