Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-40
S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
SMU1: Forces
vces
, default current limit, measures
ices
SMU2: Forces
vsub
, default current limit
Example
result = ices(e, b, c, sub, vces, vsub)
Schematic
id1
This subroutine measures drain current (I
DS
) at a specified gate-source voltage (V
GS
), drain-source voltage (V
DS
),
and substrate-source voltage (V
BS
).
Usage
double id1(int
d
, int
g
, int
s
, int
sub
, double
vgs
, double
vds
, double
vbs
)
d
Input
The drain pin of the device
g
Input
The gate pin of the device
s
Input
The source pin of the device
sub
Input
The substrate pin of the device
vgs
Input
The forced gate voltage, in volts
vds
Input
Drain voltage, in volts
vbs
Input
Substrate bias, in volts
Returns
Output
The measured drain current
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
BS
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
