S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-27
fimv
This subroutine forces a current and measures a voltage on a device with four high (source) pins and four ground
pins. This is an alternate version of the
fvmi
subroutine.
Usage
double fimv(int
h1
, int
h2
, int
h3
, int
h4
, int
l1
, int
l2
, int
l3
, int
l4
, double
*v
, double
i
);
h1
Input
HI pin 1
h2
Input
HI pin 2
h3
Input
HI pin 3
h4
Input
HI pin 4
l1
Input
LO pin 1
l2
Input
LO pin 2
l3
Input
LO pin 3
l4
Input
LO pin 4
v
Output
Measured voltage
i
Input
Forced current, in amperes
Returns
Output
Measured voltage:
0.0 = All high or low pins are <1
Details
Input a
-1
if the pin is not to be used.
A delay is incorporated into the
fimv
subroutine; this delay is the calculated time required for stable
forcing of
i
with a 30 V voltage limit (default).
Source-measure units (SMUs)
SMU1: Forces current, default voltage limit, measures voltage
Example
result = fimv(h1, h2, h3, h4, l1, l2, l3, l4, &v, i);
Schematic
Figure 7: Schematic for the fimv subroutine
