Model 2651A High Power System SourceMeter® Instrument Reference Manual
Section 6: Instrument programming
2651A-901-01 Rev. A / March 2011
6-47
Some suggestions for increasing the available memory:
•
Turn the instrument off and on. This deletes scripts that have not been saved and reloads only scripts
that have been stored in nonvolatile memory.
•
Remove unneeded scripts from nonvolatile memory. Scripts are loaded from nonvolatile memory into
the runtime environment when the instrument is turned on. See
Delete user scripts from the instrument
(on page 6-45).
•
Reduce the number of TSP-Link
®
nodes.
•
Delete unneeded global variables from the runtime environment by setting them to
nil
.
•
Set the source attribute of all scripts to
nil
.
•
Adjust
the
collectgarbage()
settings in Lua. See
more information.
•
Review scripts to optimize their memory usage. In particular, you can see memory gains by changing
string concatenation lines into a Lua table of string entries. You can then use the
table.concat()
function to create the final string concatenation.
CAUTION
If the instrument encounters memory allocation errors when the memory used is above 95 percent,
the state of the instrument cannot be guaranteed. After attempting to save any important data, it is
recommended that you turn off power to the instrument and turn it back on to return the instrument to
a known state. Cycling power resets the runtime environment. Unsaved scripts will be lost.
TSP-Link system expansion interface
Overview
The TSP-Link
®
expansion interface allows the Model 2651A instrument to communicate with other
Test Script Processor (TSP
®
) enabled instruments. The test system can be expanded to include up to
32 TSP-Link enabled instruments.
CAUTION
Combining two Model 2651A instruments to achieve greater currents in both source voltage and
source current applications requires specific precautions including configuration settings. Make sure
you adequately understand the risks involved and the measures needed to accommodate the
combination of two Model 2651A instruments. To prevent damage to the Model 2651A, connected
instruments, as well as the device under test, make sure proper procedures are not used. For further
informatio (http://www.keithley.com) for application notes on
combining two Model 2651A instruments' channels.
